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Thin, highly oriented layers of poly (tetrafluoroethylene) (PTFE, Teflon ~) were produced with a simple mechanical deposition technique. Previously, it was shown that these films are exceptionally efficient substrates for oriented growth of a variety of materials. In this communication we report on the structure of the PTFE layers, as revealed with the atomic force microscope (AFM), at a resolution sufficient to distinguish the individual macromolecules. AFM images showed the surface roughness from scan sizes of a few nanometres up to 40/~m. Analysis of damaged films allowed an estimation of the film thickness, which ranges from ~ 15 to 40 nm thick.

Посилання на статтю:

Molecular resolution of thin, highly oriented poly(tetrafluoroethylene) films with the atomic force microscope / Helen Hansma, Farshad Motamedi*, Paul Smith*t and Paul Hansma // Polymer. – 1992. – Vol 33. – P. 647-649.

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