X-ray photoelectron spectroscopy (X.p.s.) and static secondary ion mass spectrometry (SSIMS) have been applied to the surface chemical analysis of charged and sterically stabilized polymer colloids. The techniques provide complementary evidence for the surface orientation of both the charged polymer end groups and polymer chains responsible for the steric barrier. The findings are discussed in terms of the particle formation mechanisms and the biological interactions of such colloid systems
Посилання на статтю:
The surface characterization of model charged and sterically stabilized polymer colloids by SSIMS and X.p.s. / A. Brindley, M. C. Davies*, R. A. P. Lynn and S. S. Davis // Polymer. – 1992. – Vol 33. – P. 1112-1115.