The density of an amorphous polymer near its interface with a flat solid surface was investigated using neutron reflectometry. Bulk poly(methyl methacrylate) with a monodisperse molecular weight in contact with a silicon single crystal wafer was the first system studied, and the emphasis was placed on the temperature dependence of the interface density profile. The temperature range studied encompassed the glass transition temperature of the polymer and a reversible change in the density profile was discovered.
Посилання на статтю:
The density profile at a polymer/solid interface / W. Wu*, C. F. Majkrzakt, S. K. Satijat, J. F. Anknert and W. J. Orts // Polymer. – 1992. – Vol 33. – P. 5081-5084.