A recently developed scanning electron microscopy (SEM) technique, which consists of the preparation of a microtomed fiat surface, staining with OsO4 or RuO4, and compositional contrast observation using backscattered electrons, was applied for high impact polystyrene and propylene-ethylene block copolymer. A clear contrast was obtained for both polymers. By minor revision, i.e. by employing the secondary electron image under a low accelerating voltage, a much better contrast was observed
Посилання на статтю:
Phase morphology of polymer blends: 2. SEM observation by secondary and backscattered electrons from microtomed and stained surface / Graciela Goizueta*, Tsuneo Chiba and Takashi Inoue // Polymer. – 1993. – Vol 34. – P. 253-256.