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Adaptation of sample preparation methods used previously for amorphous glassy polymers has also allowed us to examine tensile deformation of thin films of poly(ether ether ketone) (PEEK), which is of particular interest given the commercial importance of this polymer. As the preliminary results presented here suggest, this appears to be a promising technique, particularly in view of the possibility of examining such films using transmission electron microscopy. In amorphous PEEK films, the dominant mode of deformation is simple shear at all temperatures below Tg. In semicrystalline PEEK, however, deformation at room temperature is characterized by both shear and crazing. Shear becomes gradually more dominant as the temperature is raised, and replaces crazing altogether above T~.

Посилання на статтю:

Deformation of thin films of poly(ether ether ketone) / C. J. G. Plummer* and H.-H. Kausch // Polymer. – 1993. – Vol 34. – P. 305-311.

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