By application of absorptive correction factor and some other improvements, the general procedure for evaluating apparent crystallinity and substantial crystallinity from wide-angle X-ray scattering patterns of binary and ternary copolymers with sufficient thickness was extended to multicomponent polymers with any thickness. The total correction factors of semicrystalline poly(ethylene oxide), amorphous poly(methyl methacrylate), polyacrylate acid, poly(ethyl acrylate), poly(butyl acrylate), poly(dimethylsiloxane), polystyrene, polybutadiene and poly(propylene oxide) were calculated. The results showed that when a diffractometer is used with reflection geometry, the influence of absorption factor can be ignored when la ~>0.5, but it should be taken into account when #t <0.5 (# is linear absorption factor and t is sample thickness).
Посилання на статтю:
Calculation of WAXS crystallinities in multicomponent polymers: the total correction factor method / Ning Yao // Polymer. – 1993. – Vol 34. – P. 1564-1566.