Light incident on a total internal reflection surface will tunnel through a submicrometre gap in the presence of a dielectric surface. This tunnelling phenomenon is used in the photon tunnelling microscope to image polyethylene single crystals, providing a topographical map of the single-crystal surface. Tunnelling increases exponentially with sample height and is quantified using video photometry of the grey-scale tunnelling image.
Посилання на статтю:
Photon tunnelling microscopy of polyethylene single crystals / Mohan Srinivasarao and Richard S. Stein // Polymer. – 1994. – Vol 35. – P. 1137-1141.